Fei nova 200 manual

The FEI xT Nova NanoLab combines a high resolution focussed ion beam (FIB) and a high resolution field emission scanning electron microscope (FESEM). It was installed in and is a flagship instrument of Australian Microscopy and Microanalysis Research Facility (AMMRF). It was upgraded to PIA mode in for higher precision of ion Missing: manual. Fei fib manual. The FEI Nova Dual-Beam FIB has been acquired under the NSF Major Research Instrumentation Program, with additional support from Arizona State University. This instrument will be made available to the ASU and broader community as a user facility, and should facilitate a wide range of applications involving the fabrication. The FEI Nova NanoLab (a dual column ultra-high resolution field emission scanning electron microscope (SEM) and focused ion beam (FIB)) was installed in January Etching with an accelerated Ga ion beam and deposition using Pt are available for nanoscale prototyping, machining, 2-D and 3-D characterization, and www.doorway.rug: manual.

The FEI Nova NanoLab (a dual column ultra-high resolution field emission scanning electron microscope (SEM) and focused ion beam (FIB)) was installed in January Etching with an accelerated Ga ion beam and deposition using Pt are available for nanoscale prototyping, machining, 2-D and 3-D characterization, and analysis. The FEI Nova Dual-Beam FIB has been acquired under the NSF Major Research Instrumentation Program, with additional support from Arizona State University. This instrument will be made available to the ASU and broader community as a user facility, and should facilitate a wide range of applications involving the fabrication of nanostructures. 1. The FEI Nova SEM/FIB system could not be started. Service had to be called and a power supply had to be replaced. A service technichian started the different pumps in correct order. 2. The cryo pump on system AJA 2 needed to be regenerated after the power failure. The cryo.

Beam Energy: eV to 30 keV down to 50eV with Beam Deceleration mode Brand: FEI NOVA NANOSEM ; Minimum feature: ~ 50nm; Detector: SED, GBSD. The FEI Nova NanoLab (a dual column ultra-high resolution field emission scanning electron microscope (SEM) and focused ion beam (FIB)) was installed in. The FEI Nova Dual Beam system is equipped with a 30 kV SEM FEG column and a 30 kV FIB column with Gallium source. There is also one Gas Injector System.